Temperature vs. Resistance Characteristics by Dopants of VO2Thick-Film Critical Temperature Sensors

Performance of Nano-Submicron-Stripe Pd Thin-Film Temperature Sensors

Dozens of small dual-beam thin-film temperature sensors with a total width down to 430 nm were fabricated and tested. The sensors were all made from 90-nm-thick Pd thin films, where the width of the narrow stripes was 70-100 nm and that of the wide ones was 210-800 nm. Two different calibration methods showed consistent and repeatable sensitivities of 0.7-1.2 μV/K for the sensors, confirming th...

Design, Fabrication and Sensitivity Analysis of the Resistance Temperature Detector Thin Film Sensors

Thin film heat transfer sensors are most cost effective resistance temperature detector (RTD) sensors for dynamic temperature measurements mainly because of very fast response time (milliseconds or less). These sensors are prepared by deposited high conducting very sensitive gauge material (platinum/nickel/silver) on the insulating surface (pyrex/macor/quartz). The purpose of this work is to fa...

Aluminum temperature coefficient of resistance vs. grain structure

Tiny Temperature Sensors

Luis Carlos first realized he might be able to make a nanothermometer while developing light-emitting diodes more than 15 years ago. His team observed that lanthanide ions in the diodes reacted to changes in temperature by reliably shifting the color they emitted. Carlos, a nanomaterials scientist based at the University of Aveiro, immediately realized that these ions might have a destiny beyon...

Quantitative Modeling for Prediction of Critical Temperature of Refrigerant Compounds

The quantitative structure-property relationship (QSPR) method is used to develop the correlation between structures of refrigerants (198 compounds) and their critical temperature. Molecular descriptors calculated from structure alone were used to represent molecular structures. A subset of the calculated descriptors selected using a genetic algorithm (GA) was used in the QSPR model development...